Kategooriad
Kategooriad
Kohaletoimetamine on tasuta!
Influence of Temperature on Microelectronics and System Reliability
Autor
Pradeep Lall (Auburn University, Alabama, Usa)
,Michael Pecht (University Of Maryland, College Park, Usa)
,Edward B. Hakim (U.s. Army Research Laboratory, Ft. Monmouth, Nj)
Presents scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. From a physics-of-failure perspective, this book explores the temperature effects on electrical parameters of both bipolar and MOSFET devices and identifies models for quantifying temperature effects on package elements.
